Dependence of the Hall Mobility and Carrier Concentration on Thickness and Annealing Temperature

Main Article Content

A. A. Shchab

Abstract

Hall effect measurements have been made on a-As2Te3 thin films different thickness film in the range (200-350) nm. The Hall mobility in a-As2Te3 thin films decreases with increasing annealing temperature but the carrier concentration increases. When increasing the film thickness increases the Hall mobility decreases, while the carrier concentration increases.

Article Details

How to Cite
1.
Dependence of the Hall Mobility and Carrier Concentration on Thickness and Annealing Temperature. IJP [Internet]. 2002 Dec. 1 [cited 2024 May 12];1(1):72-4. Available from: https://ijp.uobaghdad.edu.iq/index.php/physics/article/view/957
Section
Articles

How to Cite

1.
Dependence of the Hall Mobility and Carrier Concentration on Thickness and Annealing Temperature. IJP [Internet]. 2002 Dec. 1 [cited 2024 May 12];1(1):72-4. Available from: https://ijp.uobaghdad.edu.iq/index.php/physics/article/view/957

Similar Articles

You may also start an advanced similarity search for this article.