Effect of thickness on structural properties of BixSb2-xTe3 thin films

  • Hussain. M. Selman
Keywords: Bismuth tellurium, antimony tellurium, alloys, thin films, thermal evaporation, structural properties.


BixSb2-xTe3 alloys with different ratios of Bi (x=0, 0.1, 0.3, 0.5, and 2) have been prepared, Thin films of these alloys were prepared using thermal evaporation method under vacuum of 10-5 Torr on glass substrates at room temperature with different deposition rate (0.16, 0.5, 0.83) nm/sec for thickness (100, 300, 500) respectively. The X–ray diffraction measurements for BixSb2-xTe3 bulk and thin films indicate the polycrystalline structure with a strong intensity of peak of plane (015) preferred orientation with additional peaks, (0015) and (1010 ) reflections planes, which is meaning that all films present a very good texture along the (015) plane axis at different intensities for each thin film for different thickness. AFM measurements for the thin films of BixSb2-xTe3, show that the grain size and the average surface roughness decreases with increasing of the percentage Bi for different thickness.

How to Cite
Selman H. Effect of thickness on structural properties of BixSb2-xTe3 thin films. IJP [Internet]. 29May2019 [cited 18May2021];17(41):15-8. Available from: https://ijp.uobaghdad.edu.iq/index.php/physics/article/view/451