Preparation of SiO2:TiO2 for High-Performance Double Layer Anti-Reflection Coating

Main Article Content

Shahed Zeyed
https://orcid.org/0009-0008-5517-1233
Alaa Nazar Abd Algaffar

Abstract

        In this work, an anti-reflection coating was prepared in the region (400-1000) nm of wavelength, with a double layer of silicon dioxide (SiO2) as an inner layer and the second layer of the mixture (SiO2) and titanium dioxide (TiO2) with certain ratios, as an outer layer using the chemical spraying method with a number of 6 sprays of layer SiO2 and 12 sprays of layer SiO2 - TiO2. Using the method of chemical spraying deposited on the glass as a substrate with a different number of sprays of SiO2, and a fixed number of TiO2-SiO2. The optical and structural properties were determined using UV-Vis spectroscopy and atomic force microscopy (AFM). The results show that by using a mixed layer, the optimal optical performance of a broadband low-reflection ARC (anti-reflection coating) was obtained. The work also reports the comparison of experimental and theoretical results with the help of MATLAB, which relies on the characteristic matrix along the visible region – near-infrared.

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How to Cite
1.
Zeyed S, Nazar Abd Algaffar A. Preparation of SiO2:TiO2 for High-Performance Double Layer Anti-Reflection Coating. IJP [Internet]. 2023 Jun. 1 [cited 2024 Dec. 22];21(2):25-32. Available from: https://ijp.uobaghdad.edu.iq/index.php/physics/article/view/1110
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Author Biographies

Shahed Zeyed, Department of Physics/College of Science for Women/University of Baghdad/Baghdad/Iraq

 

 

 

 

Alaa Nazar Abd Algaffar, Department of Physics/College of Science for Women/University of Baghdad/Baghdad/Iraq

 

 

 

 

References

G. Bao and Y. Wang, J. Optic. Soci. America A 30, 656 (2013).

K. Seshan and D. Schepis, Handbook of Thin Film Deposition. 4th Ed. (UK, Elsevier-William Andrew, 2018).

J.-M. Yang and C.-Y. Kao, Proceedings of the 2000 Congress on Evolutionary Computation. CEC00 (Cat. No. 00TH8512) (IEEE, 2000). p. 978.

L. Li, Q.-H. Wang, D.-H. Li, and H.-R. Peng, Optic. Expre. 17, 16920 (2009).

İ. G. Kavakli and K. Kantarli, Turk. J. Physi. 26, 349 (2002).

B. Zhang, J. Hendrickson, N. Nader, H.-T. Chen, and J. Guo, Appl. Phys. Lett. 105, 241113 (2014).

R. H. Ali, K. A. Aadim, and A. N. Abd Algaffar, J. Phys.: Conference Series (IOP Publishing, 2021). p. 012081.

H. G. Rashid, K. A. Mishjil, H. T. Hassim, A. N. Abd Algaffar, and N. F. Habubi, J. Phys.: Conference Series (IOP Publishing, 2021). p. 012045.

A. N. Abd Al-Gaffar, Bagh. Sci. J. 8, 495 (2011).

A. N. Abd Algaffar and A. I. A. Al-Numan, Bagh. Sci. J. 15, 287 (2018).

N. K. Abdalameer, S. N. Mazhir, and K. A. Aadim, Ener. Repo. 6, 447 (2020).

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