SELMAN, Hussain. M. Effect of thickness on structural properties of BixSb2-xTe3 thin films. Iraqi Journal of Physics, Baghdad, Iraq., v. 17, n. 41, p. 15–28, 2019. DOI: 10.30723/ijp.v17i41.451. Disponível em: https://ijp.uobaghdad.edu.iq/index.php/physics/article/view/451.. Acesso em: 19 dec. 2024.