ALIAS, M. F.A. Study of the Electronic Properties and Hall Effect of Amorphous Si1-xGex:H Thin Films. Iraqi Journal of Physics, Baghdad, Iraq., v. 7, n. 10, p. 24–29, 2009. Disponível em: https://ijp.uobaghdad.edu.iq/index.php/physics/article/view/876. Acesso em: 23 dec. 2024.